SiROP
Login   
Language
  • English
    • English
    • German
Home
Menu
  • Login
  • Register
  • Search Opportunity
  • Search Organization
  • Create project alert
Information
  • About SiROP
  • Team
  • Network
  • Partners
  • Imprint
  • Terms & conditions
Register now After registration you will be able to apply for this opportunity online.
This opportunity is not published. No applications will be accepted.

Design of Dynamic On-State Resistance Measurement Setup for GaN HEMTs

In this project, you will design a setup for dynamic on-state resistance measurements, covering circuit design, PCB layout, and FPGA code implementation.

Keywords: "Wide band-gap semiconductor, GaN HEMT, On-state resistance, Hardware design, Measurement"

  • GaN high-electron-mobility transistors (HEMTs) are increasingly popular in power electronic systems due to their advantages over Si/SiC devices. However, GaN HEMTs exhibit a dynamic behavior in on-state resistance, where the Rds,on immediately after switching on is higher than its DC value. Also, it has been found that the value of Rds,on is dependent on multiple factors, including the switching condition (hard or soft). The figure above shows an exemplary circuit to measure the Rds,on under hard or soft switching conditions. At HPE, a GaN HEMT is investigated for an inverter system, where accurate measurements of its dynamic Rds,on behavior are crucial for loss modeling and system optimization. In this project, you will design a setup for dynamic Rds,on measurements, covering circuit design, PCB layout, and FPGA code implementation. In case of a master thesis, you will validate the setup and measure the characteristics of the device.

    GaN high-electron-mobility transistors (HEMTs) are increasingly popular
    in power electronic systems due to their advantages over Si/SiC devices.
    However, GaN HEMTs exhibit a dynamic behavior in on-state resistance,
    where the Rds,on immediately after switching on is higher than its DC
    value. Also, it has been found that the value of Rds,on is dependent on
    multiple factors, including the switching condition (hard or soft). The
    figure above shows an exemplary circuit to measure the Rds,on under hard
    or soft switching conditions.
    At HPE, a GaN HEMT is investigated for an inverter system, where accurate
    measurements of its dynamic Rds,on behavior are crucial for loss
    modeling and system optimization. In this project, you will design a setup
    for dynamic Rds,on measurements, covering circuit design, PCB layout,
    and FPGA code implementation. In case of a master thesis, you will validate
    the setup and measure the characteristics of the device.

  • Ruida Zhang and Anliang Hu (co-supervision), ETL G12, zhang@hpe.ee.ethz.ch

    Ruida Zhang and Anliang Hu (co-supervision), ETL G12, zhang@hpe.ee.ethz.ch

  • 10% Coding 55% Hardware Design 15% Simulation 20% Theory

    10% Coding
    55% Hardware Design
    15% Simulation
    20% Theory

  • Interest/knowledge in design of power electronic systems, Working language: English

    Interest/knowledge in design of power electronic systems, Working language: English

  • Dr. Jürgen Biela

    Dr. Jürgen Biela

Calendar

Earliest start2024-11-27
Latest end2025-05-31

Location

Laboratory for High Power Electronic Systems (ETHZ)

Labels

Semester Project

Master Thesis

Topics

  • Engineering and Technology

Documents

NameCommentSizeActions
SAMA_Zhang_dRdson_Measurement.pdf917KBDownload
SiROP PARTNER INSTITUTIONS