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Self-induced back action trapping
Self-induced backaction (SIBA) trapping is a concept developed in optics for trapping of polarizable particles [1,2]. The goal of this project is the analyze, design and characterize an electromechanical analog of SIBA trapping.
The operating principle is shown in the figure below. An electrical LC resonator with resonance frequency !0 is driven by an external source. The electric field between the capacitor plates exerts a force on a particle (mass m) attached to a restoring spring (stiffness k) and attracts it towards the capacitor. The particle changes the capacitance C and detunes the resonance of the LC circuit. As a consequence, the field between the capacitor plates drops and the force on the particle weakens. The particle is then pulled back by the spring and the resonance in the LC circuit is restored. From here, the procedure repeats itself.
The student will 1) theoretically analyze the electrical SIBA trap shown in the figure, 2) develop alternative schemes (using electrostatic and magneto-static forces), 3) design an experiment and characterize the performance of an electromechanical SIBA trap.
References:
[1] M. L. Juan et al., “Self-induced back-action optical trapping of dielectric nanoparticles,” Nature Phys. 5, 915–919 (2009).
[1] N. Descharmes et al., “Observation of backaction and self-induced trapping in a planar hollow
photonic crystal cavity,” Phys. Rev. Lett. 110, 123601 (2013).
The operating principle is shown in the figure below. An electrical LC resonator with resonance frequency !0 is driven by an external source. The electric field between the capacitor plates exerts a force on a particle (mass m) attached to a restoring spring (stiffness k) and attracts it towards the capacitor. The particle changes the capacitance C and detunes the resonance of the LC circuit. As a consequence, the field between the capacitor plates drops and the force on the particle weakens. The particle is then pulled back by the spring and the resonance in the LC circuit is restored. From here, the procedure repeats itself. The student will 1) theoretically analyze the electrical SIBA trap shown in the figure, 2) develop alternative schemes (using electrostatic and magneto-static forces), 3) design an experiment and characterize the performance of an electromechanical SIBA trap.
References: [1] M. L. Juan et al., “Self-induced back-action optical trapping of dielectric nanoparticles,” Nature Phys. 5, 915–919 (2009). [1] N. Descharmes et al., “Observation of backaction and self-induced trapping in a planar hollow photonic crystal cavity,” Phys. Rev. Lett. 110, 123601 (2013).
Not specified
Andrei Militaru (andreimi@ethz.ch), Lukas Novotny (lnovotny@ethz.ch)
Andrei Militaru (andreimi@ethz.ch), Lukas Novotny (lnovotny@ethz.ch)