Register now After registration you will be able to apply for this opportunity online.
This opportunity is not published. No applications will be accepted.
Design and Implementation of a Novel Non-intrusive Switching Loss Measurement PCB for WBG Semiconductors
In this project, you will design and implement a non-intrusive switching loss measurement PCB. Then, you will implement the control algorithm on an existing FPGA to measure the switching losses. Based on the measurement results and with PLECs/LTspice simulations, you will investigate the optimal converter operation strategy, parasitics and load inductor.
At HPE, Wide Band Gap (WBG) semiconductor device models are developed for SiC MOSFETs and GaN HEMTs. In order to validate these models, accurate switching loss measurements are crucial. A limited measurement accuracy results mainly from the current measurement in traditional Double Pulse Tests. Usually, a current measurement device is inserted into the current path which adds extra parasitics that influence the switching transients. Therefore, a novel non-intrusive switching loss measurement based on the opposition method has been proposed.
In this project, you will first understand the working principle of this nonintrusive switching loss measurement technique, including both hard and soft switching operations. To accurately measure the switching losses, you will also investigate the optimal operation strategy. As a next step, you will design and implement the PCB for the measurement setup. In a next step, you will implement the control algorithm on an existing FPGA and perform some switching loss measurements. Depending on the accuracy of the preliminary results, more detailed investigation of the converter operation, PCB parasitics, and load inductor might be required.
At HPE, Wide Band Gap (WBG) semiconductor device models are developed for SiC MOSFETs and GaN HEMTs. In order to validate these models, accurate switching loss measurements are crucial. A limited measurement accuracy results mainly from the current measurement in traditional Double Pulse Tests. Usually, a current measurement device is inserted into the current path which adds extra parasitics that influence the switching transients. Therefore, a novel non-intrusive switching loss measurement based on the opposition method has been proposed.
In this project, you will first understand the working principle of this nonintrusive switching loss measurement technique, including both hard and soft switching operations. To accurately measure the switching losses, you will also investigate the optimal operation strategy. As a next step, you will design and implement the PCB for the measurement setup. In a next step, you will implement the control algorithm on an existing FPGA and perform some switching loss measurements. Depending on the accuracy of the preliminary results, more detailed investigation of the converter operation, PCB parasitics, and load inductor might be required.
SAMA_2023HS_Opposition_Method.pdf
