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Optical sensing with a resonant tunneling device
In this project, an optical multilayer structure will be analyzed, fabricated and characterized. The objective is to fabricate the device and measure the reflectance spectrum for different angles.
In this project, an optical multilayer structure will be analyzed, fabricated and characterized.
As shown in the figure, the multillayer structure consists of different dielectric materials and is excited at a critical resonant angle o with a laser beam of wavelength . The reflectivity of the structure features a pronounced resonance, which is the result of an optical tunneling effect [1]. The resonance wavelength o depends on external parameters, such as pressure or temperature. Thus, a shift of the resonance peak provides a direct readout signal for the parameter to be sensed.
The objective is to fabricate the device and measure the reflectance spectrum for different angles.
[1] R. Sainidou et al., “Extraordinary all-dielectric light enhancement over large volumes,” Nano Lett. 10, 4450–4455 (2010).
In this project, an optical multilayer structure will be analyzed, fabricated and characterized. As shown in the figure, the multillayer structure consists of different dielectric materials and is excited at a critical resonant angle o with a laser beam of wavelength . The reflectivity of the structure features a pronounced resonance, which is the result of an optical tunneling effect [1]. The resonance wavelength o depends on external parameters, such as pressure or temperature. Thus, a shift of the resonance peak provides a direct readout signal for the parameter to be sensed. The objective is to fabricate the device and measure the reflectance spectrum for different angles.
[1] R. Sainidou et al., “Extraordinary all-dielectric light enhancement over large volumes,” Nano Lett. 10, 4450–4455 (2010).
Not specified
Martin Frimmer (mfrimmer@ethz.ch), Lukas Novotny (lnovotny@ethz.ch)
Martin Frimmer (mfrimmer@ethz.ch), Lukas Novotny (lnovotny@ethz.ch)