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FIB-SEM Imaging of Electrode Microstructure in Lithium Ion Batteries
The goal of this project is to develop a standardized protocol to image existing, micrometer
scale samples using focused ion beam (FIB) milling and SEM imaging. In the second part
the data is post processed, analyzed and correlated with the existing x-ray imaging data.
Keywords: LIB, lithium, battery, microstructure, SEM, FIB, vision, material, x-ray, imaging, micro, 3d
Our group studies the performance and degradation of different components in Lithium
Ion Batteries (LIBs). Different imaging techniques like Scanning Electron Microscopy (SEM)
and synchrotron x-ray imaging allows us to study these phenomena. However, they all have
their individual limitation such as resolution. In order to get a full understanding it is highly
interesting to combine different techniques.
We measured crystallographic properties of pristine and cycled particles of the positive
electrode of a lithium ion battery in 3D using x-ray imaging. We would now like to correlate
the findings from this to morphologic changes in the particles (eg. Cracking) by imaging
the same samples with high resolution.
You will
- learn to use FIB-SEM imaging
- learn to post process, segment and analyze the images.
- correlate the result with the existing data.
Requirements
- Interest in laboratory work and sample preparation.
- Interest in FIB-SEM characterization techniques
- Basic knowledge of Matlab or python is beneficial
- ~70% Practical / Measurements, ~30% Analysis
Our group studies the performance and degradation of different components in Lithium Ion Batteries (LIBs). Different imaging techniques like Scanning Electron Microscopy (SEM) and synchrotron x-ray imaging allows us to study these phenomena. However, they all have their individual limitation such as resolution. In order to get a full understanding it is highly interesting to combine different techniques. We measured crystallographic properties of pristine and cycled particles of the positive electrode of a lithium ion battery in 3D using x-ray imaging. We would now like to correlate the findings from this to morphologic changes in the particles (eg. Cracking) by imaging the same samples with high resolution.
You will - learn to use FIB-SEM imaging - learn to post process, segment and analyze the images. - correlate the result with the existing data. Requirements - Interest in laboratory work and sample preparation. - Interest in FIB-SEM characterization techniques - Basic knowledge of Matlab or python is beneficial - ~70% Practical / Measurements, ~30% Analysis
The goal of this project is to develop a standardized protocol to image existing, micrometer
scale samples using focused ion beam (FIB) milling and SEM imaging. In the second part
the data is post processed, analyzed and correlated with the existing x-ray imaging data.
The goal of this project is to develop a standardized protocol to image existing, micrometer scale samples using focused ion beam (FIB) milling and SEM imaging. In the second part the data is post processed, analyzed and correlated with the existing x-ray imaging data.
Nils Wenzler, wenzlern@ethz.ch
Prof. Dr. Vanessa Wood, wood@ethz.ch
Nils Wenzler, wenzlern@ethz.ch Prof. Dr. Vanessa Wood, wood@ethz.ch