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Bending gratings for refraction-based x-ray imaging
Refraction-sensitve x-ray imaging relies on large optical elements with coherent microstructures. These are often manufactured in silicon with methods similar to the ones in the chip-making industry. For large-field-of-view imaging the silicon wafers with the optical element etched into it needs to be precisely bent. The project is about investigation of the limits of the precision of the bending, as well as the minimal possible radius. It will involve theoretical mechanical considerations, design of test fixtures for bending and test measurements: both purely mechanical and in the x-ray beam. The result project is part of a larger effort to built a clinical refraction-sensitive dedicated breast CT system.